Electrophysics offers a complete line of high-performance infrared cameras, thermal imaging and night vision cameras. Our products include: image intensifier, IR thermal imaging, low light products and more.
  google
only search Electrophysics.com SITE MAP USA
    Infrared Cameras 
   Product Information
    Home > Infrared Cameras >
   
     Features
  		• 0.8 to 2.5 µm response
  		• Solid-state TE-cooled FPA
  		• High quantum efficiency
  		• Variable snapshot integration
  		• Interchangeable C-mount optics
  		• Real-time 14 bit digital output
     
    Overview
     
    Models Return to top of the page
     
    Silver 220S CameraCamera with AC power supply, RS-232 control software (CD), 5M serial cable, carrying/storage ase 
     
    Specifications Return to top of the page
     
    Sensor TypeMCT 
    Spectral Response.85 to 2.5 µm 
    Array Resolution320 x 256 
    Detector Pitch30 µm 
    Readout ModeSnapshot (simultaneous integration) 
    Sensitivity<2A/D count 
    Frame Rate - Full FrameVariable 1 to 200Hz (USB/CAMLINK) 
    Sub-Array Windowing320 x 256, 320 x 128, 320 x 64 
    Integration TimeVariable <10 µs to 20 ms 
    Spectral Filter WheelSnap-in (accepts 25mmOD x 1mm filters, not supplied) 
    External SynchronizationTTL 
    Video OutputRS-170 
    Video Frame BufferIncluded 
    Digital OutputUSB2.0 and CAMLINK 
    Cooling4-stage TE cooler (˜200K set point) 
     
    Application Return to top of the page
     
    IR Inspection in Design, Test and Manufacturing
    Thermal imaging has become an extremely valuable technology in many industries not only as an R&D instrument but also as a test and predictive maintenance tool. Infrared imaging plays a vital role in many manufacturing industries having a large number of electro-mechanical components.
     
    Art Conservation
    Works of art are subject to a variety of disfiguring ills, many of them caused by environmental effects, particularly temperature and humidity changes and pollution. Much modern conservation effort is directed toward producing a stable, favorable situation for the display of art works and maintaining regular inspection and diagnostic procedures to combat deterioration. In the near infrared spectral range (700 nm – 2500 nm), paint layers become transparent, depending on their chemical composition, the layer thickness, and the wavelength. Near infrared imaging can reveal under drawings, over paintings, signatures and other hidden features useful for the analysis of the artwork.
     
    Laser Beam Diagnostics
    For many applications, it is extremely important to know the cross-sectional profile of a laser beam. In this way, the power, energy density, modal structure and divergence of the laser can be determined. These properties impact the propagation of the beam in a wide variety of applications and ultimately determine the usefulness of the laser in each application. Infrared imagers offer an ideal method for analyzing laser beam profiles from 800 nm to 20 microns.
     
    Target Signature Measurements
    The spectral characteristics of vehicles, weapons and countermeasures have been found to be important for many applications. Broad spectral range, high resolution and high sensitivity are key features of an infrared imager for these applications. We offer multi spectral imaging systems with a wide range of optics from microscope to telescopes. In addition we offer powerful data acquisition systems featuring multiple camera synchronization, real-time image capture and radiometric analysis.


     
     
    Image Gallery Return to top of the page
     
    No Images available for this category
     
    Product PDF
    Product FAQ
    On-line Demo
    Compare Models
       Get More Information
    Request Information
    Request a Demo
    Pricing/Quotation
    Newsletter Sign Up
       Other Helpful Links
    GSA Schedule
    Product Rentals
    Application Training
    Export Controls
    Email to a Friend
    Print this Page
    PRODUCTS
    CAREERS
    CONTACT US
    PRIVACY POLICY
    SITE MAP
    HowNightVisionWorks
    Copyright © 2010 Electrophysics Corp. All rights reserved.